Full-Time

Electronic Design Engineer

Direct Staffing

Direct Staffing

No salary listed

Austin, TX, USA

In Person

Category
Hardware Engineering (1)
Requirements
  • Master's degree in Electrical Engineering or a related field (EE MS or PhD)
  • Minimum 6 years of working experience in a high-speed broadband communication post-silicon analog test environment
  • Expert in PHY test methodologies per IEEE standards, at least in one of 10 GbE, 40/100 GbE, or 100 GbE standards listed (IEEE 802.3ae, IEEE 802.3ak, IEEE 802.3ap, IEEE 802.3aq, IEEE 802.3ba, IEEE 802.3bg, IEEE 802.3bj, IEEE 802.3bm)
  • Experience with post-silicon analog electrical parameter testing of PHY SerDes in high-speed broadband ASICs
  • Eligible for visa (visa candidates welcome) is not a professional requirement but is a stated consideration; include as general eligibility note if needed
  • Ability to develop comprehensive test plans and test strategies for post-silicon analog parameters
  • Familiarity with bench test automation development and generation of test reports
Responsibilities
  • Develop comprehensive test plans and test strategies for post-silicon analog electrical parameters of physical layer SerDes of high-speed broadband mixed-signal ASICs
  • Develop and optimize PHY electrical bench test methodologies and procedures per industry standards including 10 GbE, 40/100 GbE, and 100 GbE
  • Perform post-silicon PHY bench testing of analog electrical parameters of high-speed broadband mixed-signal ASICs
  • Lead and train junior engineers
  • Generate comprehensive test reports and analysis
  • Develop and implement bench test automation
  • Collaborate with IC design team on chip performance optimization and failure analysis
Desired Qualifications
  • Experience with Keysight DCA-J and J-BERT equipment
  • Visa status being welcome is not strictly required but can be noted as a preference for applicants; refers to eligibility rather than qualification
  • Master's degree or PhD in Electrical Engineering or related field with substantial post-silicon analog test experience is already captured in requirements

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