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Keysight Technologies (NYSE: KEYS) has launched FITS-16CH, a system that validates digital-layer error performance in optical and copper interconnects. It has 16 transmit and 16 receive channels, twice the density of the FITS-8CH. The platform combines bit error ratio and forward error correction measurements to show how complete interconnect assemblies perform in real-world conditions. It supports 106G and 212G lane rates for 800G interconnects and emerging 1.6T technologies. An automated tuning tool can cut transmit tuning from hours, days, or weeks to a few minutes. The system works with Keysight analyzers, bit error ratio testers, and oscilloscopes. Credo Technologies' Ameet Suri said the tool lets the company test active electrical cables at system level during development and qualification.

Simplifying device testing from DC to 250GHz. Wednesday 14th October 2026 Keysight, Glasgow University, NPL and MPI develop single-sweep method for continuous on-wafer InP HEMT characterisation Keysight Technologies has collaborated with the University of Glasgow, the National Physical Laboratory (NPL), and MPI to develop a new approach to broadband characterisation of next-generation sub-terahertz (sub-THz) semiconductor devices. Together, the organisations demonstrated continuous on-wafer characterisation of InP HEMTs from near DC to 250 GHz in a single sweep, simplifying broadband measurements for advanced semiconductor research and design. As semiconductor technologies move into mmWave and sub-terahertz frequencies for next-generation applications, engineers need to accurately characterise transistor performance across increasingly broad frequency ranges. Conventional approaches can require multiple measurement setups and calibrations, adding complexity and making it more difficult to obtain consistent data for broadband device modeling. The four organisations combined Keysight instrumentation, University of Glasgow semiconductor devices, MPI Corporation on-wafer probing technology, and NPL metrology expertise to create the broadband measurement solution. The Keysight tools included the PNA-X Vector network analyser; the Single-Sweep 250 GHz frequency extender; and its Precision Source/Measure Unit (SMU). Together, these technologies enabled continuous measurement from near DC to 250 GHz with a single probe touchdown, eliminating the need for multiple setup changes and providing consistent broadband S-parameter measurements. Built-in source filtering and broadband source power calibration also helped ensure signal purity of the applied mmWave signal at the probe-tip. Thierry Locquette, VP of sales, Europe, Middle East & Africa at Keysight said: "Characterising devices continuously from near DC to 250 GHz in a single sweep can significantly simplify the measurement process for researchers developing next-generation semiconductor technologies. By bringing together expertise in instrumentation, devices, probing, and metrology, this collaboration demonstrates a practical approach to generating the consistent broadband data engineers need to accelerate device development." Xiaobang Shang, principal scientist and On-wafer Measurement Lead at NPL, said: "Accurate on-wafer measurement is essential for developing reliable semiconductor devices, particularly as technologies move further into the millimetre-wave and sub-terahertz frequency ranges. We were pleased to contribute NPL's high-frequency on-wafer metrology and calibration expertise to this collaboration, helping demonstrate a practical route to consistent broadband device measurements using the state-of-the-art single sweep system." Matthew White, director of Business Development at MPI, said: "Extending on-wafer characterisation to 250 GHz requires the probing, calibration, and measurement platform operating as one seamlessly integrated system. This collaboration demonstrates a practical approach to achieving consistent broadband measurements from near DC to 250 GHz with a single probe touchdown, helping researchers simplify characterisation and accelerate device development with great confidence." SPONSOR MESSAGE Unifying software and semiconductor development. Software-defined workflows are reshaping the way smart, connected products are designed. The merging of software functionality and hardware intricacies is pushing traditional workflows beyond their capabilities, leaving teams at a developmental crossroads. With this fundamental shift comes the critical need for end-to-end traceability and robust collaboration tools that easily integrate into existing workflows to unify hardware and software development. In this new software-defined era, how can companies break down the silos that have historically defined software and silicon development workflows?

Keysight Technologies, Inc. announces two new 1.6T Ethernet test platforms SERT 1600ge and AresONE Plus 1600ge. Published on 10/13/2026 at 02:20 pm EDT S&P Capital IQ Keysight Technologies, Inc. announced two new 1.6T Ethernet test platforms, Switch and Edge Router Tester (SERT) 1600GE and AresONE Plus 1600GE, designed to help customers validate next-generation AI data center and hyperscale networking infrastructure. AresONE Plus 1600GE sets a new benchmark by delivering eight 1.6T Ethernet ports in a single 2U appliance while providing stateful, realistic AI workload generation with mix-of-experts emulation. SERT 1600GE targets data center switch fabric and edge router validation, while AresONE Plus 1600GE adds AI workload emulation and high-density switch fabric testing. The combined platforms provide a consistent test foundation for device qualification, routing, and AI fabric validation. They also enable performance, interoperability, and control-plane evaluation as networks scale. AresONE Plus 1600GE packs eight OSFP1600 ports into a single 2U chassis, delivering 12.8T of line-rate traffic at 64 bytes. It supports 1600GE PAM4 signaling over 224G SerDes with backward compatibility to 112G, plus flexible port breakout of 1x1600GE, 2x800GE, 4x400GE, or 8x200GE. SERT 1600GE is available in eight-port 2U configuration for switch fabric scale testing. In common with the AresONE Plus 1600GE platform, it is capable of being time synchronized using Precision Time Protocol (PTP), for larger topologies, offering flexibility to scale test environments as network configurations grow. Both platforms support Border Gateway Protocol (BGP), Equal-Cost Multipath (ECMP), Virtual Extensible LAN (VXLAN), and SONiC validation across routing, bridging, and access use cases. AresONE Plus 1600GE also provides core routing scale for control-plane testing. AresONE Plus 1600GE integrates with Keysight AI Data Center Builder software for mix-of-experts emulation, RoCEv2, Priority Flow Control (PFC), Explicit Congestion Notification (ECN), and Ultra Ethernet Consortium (UEC) support. These capabilities let customers exercise both network protocols and AI traffic behavior in the same validation environment to identify performance and congestion issues before deployment. Both platforms support DAC, ACC, AEC, AOC, and coherent optics in both IHS and RHS form factors. AresONE Plus 1600GE can dynamically switch between an eight-port mode for data center switch qualification and a four-port mode for AI benchmarking on the same chassis, helping teams use one appliance across multiple test scenarios and gain more value from their test infrastructure. Through collaboration with NVIDIA, Keysight AresONE Plus 1600GE provides the high-performance validation platform needed to stress these capabilities with 1.6T/800GE traffic throughput, 224G SerDes, routing-scale validation, and realistic AI workload emulation, enabling rigorous performance and congestion testing before deployment. Keysight is showcasing the new platforms at Open Compute Project (OCP) Global Summit booth #C83 in San Jose Convention Center, October 12-15. (C) S&P Capital IQ - 2026